Optical Properties Of Multilayer Stacks

The optical properties of a-Si:H multilayer stacks are determined by comparing thernmeasured reflectance and transmittance spectra with a computer simulation usingrnsimple dielectric function models. The samples were produced in the research centerrnJuelich (Germany), where also the reflectance spectra were obtained in the spectralrnregion between 4,000 cm·1< wavenumber < 40,000 cm·1rn• The transmittance spectra inrnthe same spectral region for the same samples were done in the AAU spectroscopyrnlaboratory. The obtained properties of the a-Si:H multilayer stacks, the layer thickness,rnthe dielectric background and the band gap energy of the individual semiconductorrnmaterials are in good agreement with the reference values

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