Ellipsometry is generally a non-invasive, non-destructive measurement techniquernto obtain optical properties of a sample material by studying the state of polarizationrnof the rernected light waves. Light polarization is a rich source of information and itsrnmeasurement is important in many applications. In ellipsometry, which is a branch ofrnoptical polarimetry, fast measurement of the state of polarization of rernected light is makingrnpossible contineous, in-situ, and non-destructive monitoring and control of industrialrnprocesses. Basic concepts of these fast polarimetric sensors, along with thier applicationsrnin di erent industries, are brierny discussed