Optimization Of Ellipsometric Components For User Friendly Determination Of Optical Parameters Of Thin Films
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In this work the optical constants and thickness of organic thin films is determinedrnusing ellipsometry technique. Because it is non-destructive and sensitive tornseveral material characteristics, such as Layer thickness, optical constants (refractivernindex and extinction coefficient), Surface roughness Composition, Optical anisotropy.rnChoosing one of the number of ellipsometry setting rotating analyzer ellipsometryrn(RAE) techniques and by optimizing the components of the ellipsometery for automatedrnway attempt was made to determine optical constants(complex and realrnrefractive index),absorption and thickness of APFO-Green6 organic thin film whichrncoated with a speed of 600rpm on glass substrate, for wavelengths 532nm, 632.8nm,rn660nm, 808nm, 1064nm for five angle of incident to each wavelength
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