Determination Of Optical Constants Of A Thin Film Using Rotating Analyzer Ellipsometry Of Multiple Angle Of Incidence

With multiple angle of incidence rotating analyzer ellipsometry, one can measurerncomplex refractive index and the thickness of a very thin film simultaneously. Thisrnmethod is applied on conducting thin film polymer (MDMO-PPV/PCBM[1:1]) forrnfive angles of incidence. In general, it is not possible to invert the Fresnel equationsrnto obtain the complex index parameters, instead, the optical method has to be developed.rnIn the model, the optical parameters are varied to minimize some chosen errorrnfunction. And those parameters which give a minimum error function are taken to bernthe correct optical constants of the sample. Additional data are also gathered fromrnabsorption measurement, and the two independent measurements are compared. Therncomplex refractive index and thickness of the sample for wavelengths 532 nm, 632.8rnnm, 808 nm and 1064 nm are determined

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