Determination Of Optical Constants And Thickness Of 3-octylphenylthiophenepopt By Rotating Angle Ellipsometry

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When a plane polarized light is reflected from the surface of an organic samplernor thin film mounted on a glass substrate called Poly 3-Octylphemylthiophene/POPTrnat some different angles of incidence around the brewster angle of the sample inrnbetween 570 up to 610 ,then the reflected light which is elliptically polarized and itsrnintensity is detected by photodetector.From its intensity curve the Fourier coefficientsrna and b are collected by fitting to Fast Non Linear Curve Fitting.Based on the FourierrnCoefficients the ellipsometric angle , and the amplitude coefficients (FresnelrnCoefficients) for parallel and perpendicular light rs and rp from the upper and bottomrnsurface of the film are computed.From the ellipsometric angles and Fresnel coefficientsrnthe optical parameters of the sample such as refractive index, extinction coefficientsrnand the film thickness are determine[5]

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Determination Of Optical Constants And Thickness Of 3-octylphenylthiophenepopt By Rotating Angle Ellipsometry

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