X-ray Study Of Dynamics Of Growing Wetting Films
Physics Project Topics
Get the Complete Project Materials Now! ยป
The dynamics of growing wetting films is studied by the method of x-ray scatteringrnin the region of total external reflection. "ith a short pulse disturbance caused byrna temperature difference between the substrate and the "apour in the x-ray cell. thernwetting film thickness is reduced. Afterwards the time dependence of the -growing filmrnis monitored by x-ray reflectivity measurements. The examined sample systems arernH2/Si. CH.3/Si . Ge/Si and a quartz glass wetted by a liquid film of CCk The obsen'edrngrowth kinetics of the wetting layers are discussed in the framework of a model whichrnis adapted to the experimental conditioll5. particularly the finite temperature stabilityrnof the experimental set-up. From the growth law l(t) rx I ~ exp:~(t/T)nl fitted to therndata. the time constants T and the dynamic exponent 11 are determined. The quallt ityrnn depends on the dimension of the growth mechanism
Subsurface Intelligence & Critical Mineral Exploration
Modern Geology projects now focus on Machine Learning in Mineral Targeting, Carbon Capture & Storage (CCS) Geologic Modeling, and Critical Mineral Systems (Lithium, REEs). If your research involves Hydrogeological Connectivity, Seismic Inversion, or Geotechnical Site Characterization, ensure your analysis follows the JORC or NI 43-101 reporting standards and utilizes robust 3D Subsurface Visualization and Geochemical Fingerprinting frameworks.
Be the First to Share On Social
RELATED TOPICS
265
Enjoying our content?
Don't miss out on new videos! Subscribe to our YouTube channel for more awesome content.
Subscribe Now!