Spectral Responses Of A-sih Thin Film Colour Sensors And Fourier Transform Spectrometer

In characterising photovoltaic devices, one of the most importantrnmeasurements is the spectral response measurement. Several information canrnbe obtained from the absolute value of the spectral response at a givenrnwavelength and from the shape of the spectral response curve. To get accuraterninformation, precise methods of measurement of the spectral response is quiternimportant. Fourier Transform Spectrometer is believed to be one of suchrnmeasurement set up which furnishes us with accurately measured spectralrnresponse curves. The use of Fourier Transform Spectrometer (FTS) forrnmeasurement of spectral response is not a new application. It had been used tornmeasure spectral response of both crystalline and amorphous silicon solar cells,rneven though the Differential Spectral Response (DSR) method is the mostrnusual one. However, bias-voltage-controlled colour sensors are quite recentrnfindings, and so far the spectral responses of them were obtained from thernDifferential Spectral Response measurement. Here, the use of FourierrnTransform Spectrometer for measurement of spectral response of a-Si:H thinrnfilm colour sensors was studied by measuring the spectral response of selectedrncolour sensors and some of the problems associated with this application werernidentified. Finally suggestions to improve the set up were given

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