Determination Of Optical Constants Of Ktp Crystal Using Ellipsometry Technique

The Thesis discusses the use of reflection ellipsometry as a precise, and non-destructiverntechnique for the determination of the optical constants of a Potassium Titanyl Phosphatern(KTP) crystal. The KTP is a biaxial orthorhombic flux grown crystal. It hasrnthree refractive indices: nx, ny and nz • Out of which only two linear refractive indicesrnnx and ny for the two reflective faces correspond to x and y axis, respectively, couldrnbe measured while the third refractive index nz could not be measured due to poorrnsurface quality.rnThe refractive indices are measured at three wavelengths in its transmission rangernusing He-Ne (>. = 632.Snm), and temperature tuned diode lasers (>. = S04.4.nmrnand>. = SOS.4nm). The obtained experimental data of the reflected intensity andrnanalyzer angles are fitted to the theoretical model of curve fitting in the computer.rnThe results of refractive indices are found in good agreement with the theoreticalrnvalues. The relative errors are assessed up to 0.170/0 for the nx at >. = 632.Snm andrn0.02S 0 /0 for ny at >. = SOS.4nm. We also demonstrate the normal behaviour of thernexperimental refractive indices nx and ny respectively

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